Electrostatic Force Microscopy (EFM) and dielectric characterisation have emerged as pivotal techniques in the exploration of nanoscale phenomena, enabling researchers to probe the electrical ...

Piezoresponse force microscopy (PFM) is an effective method for examining ferroelectric materials due to its nanometer-level resolution and high sensitivity, inherited from atomic force microscopy ...

Researchers have discovered that ferroelectric fluids can harness an overlooked transverse electrostatic force (TEF) to rise over 80 mm, without magnets or high voltages. By exploiting the fluid's ...

Also known as surface potential microscopy, Kelvin probe force microscopy (KPFM) is one method in the range of electrical characterization techniques available in atomic force microscopes. The contact ...

Kelvin probe force microscopy (KPFM) is a key electrical mode used in scanning probe microscopy. It measures a fundamental physical property of materials – a surface potential. Compared to other modes ...