Electrostatic Force Microscopy (EFM) and dielectric characterisation have emerged as pivotal techniques in the exploration of nanoscale phenomena, enabling researchers to probe the electrical ...

Also known as surface potential microscopy, Kelvin probe force microscopy (KPFM) is one method in the range of electrical characterization techniques available in atomic force microscopes. The contact ...

Researchers have discovered that ferroelectric fluids can harness an overlooked transverse electrostatic force (TEF) to rise over 80 mm, without magnets or high voltages. By exploiting the fluid's ...

Piezoresponse force microscopy (PFM) is an effective method for examining ferroelectric materials due to its nanometer-level resolution and high sensitivity, inherited from atomic force microscopy ...

Ferroelectric fluids use a strong transverse electrostatic force to climb 80 mm, enabling lightweight, low-voltage motors and compact energy-efficient actuators. (Nanowerk News) Researchers have ...

The world of nanoscale analysis has been revolutionized by the advent of electrical Atomic Force Microscopy (AFM) modes. New possibilities for measuring electrical properties with remarkable precision ...