Atomic force microscopy (AFM) is a standard imaging technique for the structural characterization of surfaces in different fields of materials science, surface science, and biology. Carbon nanotubes ...

(Nanowerk Spotlight) The foremost atom of the tip in a scanning probe microscope is critically important for precise imaging results – similar to role of the objective lens in an optical microscope.

A standard single frequency AFM is comprised of a boron-doped silicon (Si) or silicon nitride (Si 3 N 4) cantilever with a length of a few micrometers and a single crystal diamond tip at the bottom of ...

Atomic force microscopy (AFM) is a method of topographical measurement, wherein a fine probe is raster scanned over a material, and the minute variation in probe height is interpreted by laser ...

Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...

Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

A further development in atomic force microscopy now makes it possible to simultaneously image the height profile of nanometer-fine structures as well as the electric current and the frictional force ...

Atomic force microscopy, or AFM, is a widely used technique that can quantitatively map material surfaces in three dimensions, but its accuracy is limited by the size of the microscope’s probe. A new ...

IR nanochemical mapping involves combining atomic force microscopy and infrared microscopy to map the chemical properties of a sample at a nanoscale. AFM-IR compositional mapping of Streptomyces ...

Atomic force microscopy is a powerful technique that has been widely used in materials research, nano-imaging, and bioimaging. It is a topographical metrology approach that is commonly utilized in ...