Atomic Force Microscopy (AFM) has evolved into a central technique in nanotechnology, providing three-dimensional imaging and precise measurements at the atomic scale. Its ability to probe surfaces by ...

Atomic force microscopy (AFM) is a standard imaging technique for the structural characterization of surfaces in different fields of materials science, surface science, and biology. Carbon nanotubes ...

(Nanowerk Spotlight) The foremost atom of the tip in a scanning probe microscope is critically important for precise imaging results – similar to role of the objective lens in an optical microscope.

First invented in 1985 by IBM in Zurich, Atomic Force Microscopy (AFM) is a scanning probe technique for imaging. It involves a nanoscopic tip attached to a microscopic, flexible cantilever, which is ...

Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

A further development in atomic force microscopy now makes it possible to simultaneously image the height profile of nanometer-fine structures as well as the electric current and the frictional force ...

Researchers have developed a deep learning algorithm for removing systematic effects from atomic force microscopy images, enabling more precise profiles of material surfaces. Atomic force microscopy, ...

Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...

Atomic force microscopy is a powerful technique that has been widely used in materials research, nano-imaging, and bioimaging. It is a topographical metrology approach that is commonly utilized in ...

Analyzing structures and physicochemical properties of biomolecules is a major field of research in biotechnology. The four major types of biological macromolecules namely, carbohydrate, proteins, ...

Atomic force microscopy, or AFM, is a widely used technique that can quantitatively map material surfaces in three dimensions, but its accuracy is limited by the size of the microscope’s probe. A new ...