Compatible with FEI’s DualBeam FIB (focused ion beam) SEM (scanning electron microscope) platform, Auto Slice & View Version 4.0 reconstruction software offers enhanced productivity, accuracy, and ...
Thermo Scientific Auto Slice and View and Maps, two automation software packages for electron/ion microscopy, are excellent for simplifying gathering common imaging techniques. However, it is rarely ...
Researchers benefit from faster FIB-SEM sample preparation, more accurate 3D tomography and greater integration in data reporting JENA/Germany – Materials and Life Science researchers can now ...
Utilizing FIB-SEM, nanofluidic lab-on-a-chip devices for the analysis of single DNA molecules were characterized and fabricated. Direct FIB nanopatterning of silicon master stamps enables the quick ...
In this interview, we speak to Martin Slama at TESCAN, who describes sample preparation using high current plasma FIB SEM. Can you describe what high current plasma FIB-SEM is? The high current plasma ...
No longer must you choose either SEM or FIB for failure analysis. Now there�s in situ testing using a dual-beam FIB/SEM tool. Traditionally, testing and failure analysis of integrated circuits (ICs) ...
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