AZOM

Plasma FIB-SEM platform for deep sectioning - TESCAN SOLARIS X

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AZOM

Combination of Plasma FIB and UHR SEM - TESCAN AMBER X

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AZoNano

ZEISS Crossbeam: FIB-SEM for High Throughput 3D Analysis and Sample Preparation

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Utilizing High Current Plasma FIB-SEM for Sample Preparation

When preparing cross sections, the standard procedure using the FIB-SEM technique is the use of high currents to quickly remove material, then lower the FIB current for an improved beam profile and ...
AZoNano

Using Advanced FIB-SEM Tomography to Characterize Solid Oxide Electrolysis Cells

Solid oxide electrolysis cells (SOEC) show great promise as an alternative to batteries for storing excess renewable energy as they achieve almost 100% electrical-to-H 2 efficiency. In the SOEC, ...