The LF210 Laser Autofocus System from Prior Scientific is designed to improve microscopic examination of a wide range of reflective samples including semiconductor wafers and hard disc drive platens.
The new catalog covers a variety of novel positioning stages and scanning systems for specimen as well as microscope objectives and the technology behind the products. Ultrasonic-ceramic motor drives ...
(Nanowerk News) PI’s line of lens positioners, designed to scan and position objectives with sub-nm resolution at high bandwidth, is expanding with a new generation of piezo Z-focus stages – the P-725 ...
The LF210 Laser Autofocus System from Prior Scientific is designed to improve microscopic examination of a wide range of reflective samples including semiconductor wafers and hard disc drive platens.
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