Örebro researchers Rajesh Patil and Professor Magnus Löfstrand have developed an AI system that detects welding defects, ...

What is the Market Size of Wafer Defect Inspection System? BANGALORE, India, Dec. 16, 2025 /PRNewswire/ -- In 2024, the global market size of Wafer Defect Inspection System was estimated to be worth ...

Modern advanced packaging processes and shrinking semiconductor device sizes mean that it is vital to consistently eliminate sub-20 nm defects and surface contaminants. To do this effectively, the ...

Researchers have resolved a long-standing debate surrounding laser additive manufacturing processes with a pioneering approach to defect detection. Researchers from EPFL have resolved a long-standing ...

SEMVision™ H20 enables better and faster analysis of nanoscale defects in leading-edge chips Second-generation “cold field emission” technology provides high-resolution imaging AI image recognition ...

SiC is extensively used in microelectronic devices owing to its several unique properties. However, low yield and high cost of the SiC manufacturing process are the major challenges that must be ...

Have you stopped to consider the impact of yield on your overall product cost? Of course you did, when you considered your yield targets and set your product goals. But is it good enough to stop once ...