Figure 1: Model of rotational defect in graphene and TMDs. In the following, we present observations of such rotational defects. By combing scanning TEM (STEM) experiments with first-principles ...
Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...
When a good die fails test and gets scrapped, often no one notices, because false failures look identical to real ones. Yet across the industry, these phantom defects are quietly eroding yield, ...
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