Researchers have developed a deep learning algorithm for removing systematic effects from atomic force microscopy images, enabling more precise profiles of material surfaces. Atomic force microscopy, ...
SANTA BARBARA, Calif.--(BUSINESS WIRE)--Oxford Instruments Asylum Research announced today the release of the new Vero VRS1250 Atomic Force Microscope (AFM), which enables video-rate imaging with line ...
Researchers have used tip-scan high-speed atomic force microscopy combined with an optical microscope to observe light-induced deformation of azo-polymer films. The process could be followed in real ...
The deep learning algorithm developed by researchers at the University of Illinois Urbana-Champaign is trained to remove the effects of the probe’s width from AFM microscope images. As reported in the ...
SANTA BARBARA, Calif.--(BUSINESS WIRE)--Oxford Instruments Asylum Research today announces the release of AR Maps, a new and powerful data analysis software package for the Jupiter XR atomic force ...
Thought LeaderProf. Dr. Sergei KalininProfessor & Chief Scientist in AI/ML for Physical SciencesUniversity of Tennessee & Pacific Northwest Laboratory In this interview, Prof. Dr. Sergei Kalinin ...
In this interview, Professor Emeritus Mervyn Miles at the University of Bristol speaks about the history and technology behind Atomic Force Microscopy (AFM) and Scanning Probe Microscopy (SPM). Can ...
This article introduces the FX200, the latest large-sample Atomic Force Microscope (AFM) from Park Systems, developed to meet both fundamental and advanced research requirements. The FX200 is ...
Researchers from Osaka University combine high-speed atomic force microscopy with a laser light source for real-time observation of azo-polymer films Osaka, Japan – Expanding our scientific ...
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